Lima, Marcelo D. de; Santos, Thales Borrely dos; Quivy, Alain André 
Source: IEEE. Conference titles: Symposium on Microelectronics Technology and Devices (SBMicro). Unidade: IF
Subjects: SIMULAÇÃO DE SISTEMAS, FOTODETECTORES
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ABNT
LIMA, Marcelo D. de e SANTOS, Thales Borrely dos e QUIVY, Alain André. Evaluation of Surface Recombination Velocity by Means of Computational Simulations and I×V Curves. IEEE. New York: IEEE-Institute of Electrical and Electronics Engineers. Disponível em: https://doi.org/10.1109/SBMicro.2019.8919450. Acesso em: 23 maio 2024. , 2019APA
Lima, M. D. de, Santos, T. B. dos, & Quivy, A. A. (2019). Evaluation of Surface Recombination Velocity by Means of Computational Simulations and I×V Curves. IEEE. New York: IEEE-Institute of Electrical and Electronics Engineers. doi:10.1109/SBMicro.2019.8919450NLM
Lima MD de, Santos TB dos, Quivy AA. Evaluation of Surface Recombination Velocity by Means of Computational Simulations and I×V Curves [Internet]. IEEE. 2019 ;03.[citado 2024 maio 23 ] Available from: https://doi.org/10.1109/SBMicro.2019.8919450Vancouver
Lima MD de, Santos TB dos, Quivy AA. Evaluation of Surface Recombination Velocity by Means of Computational Simulations and I×V Curves [Internet]. IEEE. 2019 ;03.[citado 2024 maio 23 ] Available from: https://doi.org/10.1109/SBMicro.2019.8919450
